Enameled wire dielectric loss test system

Performance Characteristics of Product ◆Executive standard: GB/T4074.5-2008/IEC60851-5 ◆Applicable to detect enameled round wires with nominal conductor diameter between 0.020mm and 3.00mm and all specifications of enameled flat wires; ◆Automatically complete the whole measurement process such as heating, sampling, curve drawing, calculation of sudden rising temperature; ◆Historic data query, curve comparison, report generation, curve charge and report printing; ◆Analysis and calculation of temperature corresponding to minimum dielectric loss, and of wave crest and trough value; ◆Capable of displaying 8 historical data curves on the same screen in different colors, convenient for data comparison and analysis; ◆Designed with two databases, namely “standard curve” and “ordinary curve”, which can store test results individually; ◆Provided with new graphite paint, convenient for painting, smooth and even, free from burrs, easy to be saved; ◆Windows platform software interface is concise and aesthetic, easy to operate. Major Technical Parameters Test temperature 40-350℃ Temperature difference between temperature test value and actual temperature value ＜±1.5℃ Test time 3~8min Test frequency 1KHz (accuracy 0.001%) Test resolution 0.0001with C＞100pF Test voltage 1.0Vrms Environmental temperature Working condition: 0℃-40℃  Transport and storage: -10℃-55℃ Environmental humidity Working condition: 30% -85%  Transport and storage: 0% -90% Input power AC220V±10%  50Hz Consumed power ≤350W Overall dimensions of host L×W×H  520×500×410mm Weight 45kg   ●Optional Model: DLTS-1000R dielectric loss test system for enameled round wires DLTS-1000F dielectric loss test system for enameled flat wires DLTS-1000M 1MHz dielectric loss test system for enameled wires